EC EN 452
Experiments in Integrated Circuit Development
Electrical and Computer Engineering
Ira A. Fulton College of Engineering
Course Description
Measurements of key silicon properties and fabrication of integrated circuits.
When Taught
Fall
Grade Rule
Grade Rule 8: A, B, C, D, E, I (Standard grade rule)
Min
1
Fixed
1
Fixed
0
Fixed
3
Other Prerequisites
EC En 450 or concurrent enrollment; or Ch En 481 or concurrent enrollment.
Title
Tools
Learning Outcome
Ability to use modern microelectronics fabrication equipment.
Title
Fabricated Devices
Learning Outcome
Ability to analyze and interpret data measured from fabricated devices.
Title
MOSFET Devices
Learning Outcome
Ability to design processes for fabrication of MOSFET devices.
