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PHSCS 588

Scanning Electron Microscopy (SEM) for Physical Science and Engineering

Physics and Astronomy College of Physical and Mathematical Sciences

Course Description

Theoretical aspects of sample preparation, basic and advanced imaging, X-ray energy dispersive spectrometry, and other analytical materials characterization techniques on the scanning electron microscope (SEM).

When Taught

Contact Department

Grade Rule

Grade Rule 8: A, B, C, D, E, I (Standard grade rule)

Min

3

Fixed

3

Fixed

2

Fixed

3