PHSCS 588
Scanning Electron Microscopy (SEM) for Physical Science and Engineering
Physics and Astronomy
College of Physical and Mathematical Sciences
Course Description
Theoretical aspects of sample preparation, basic and advanced imaging, X-ray energy dispersive spectrometry, and other analytical materials characterization techniques on the scanning electron microscope (SEM).
When Taught
Contact Department
Grade Rule
Grade Rule 8: A, B, C, D, E, I (Standard grade rule)
Min
3
Fixed
3
Fixed
2
Fixed
3